SediGraph III Plus

The new SediGraph® III Plus determines particle size by using the highly accurate and reproducible sedimentation technique which measures the gravity-induced settling rates of different size particles in a liquid with known properties. This is simple yet extremely effective technique for providing particle size information for a wide variety of materials.

Description

SediGraph III Plus

 

Proven Technique and Reliability

For over three decades, the Micromeritics SediGraph has remained the standard instrument for particle size analysis in many laboratories throughout the world. Whether in a rugged production environment or a controlled laboratory setting, the SediGraph continues to produce accurate results with superior reliability. Particle size distribution is measured using the sedimentation method. Particle mass is measured directly via X-ray absorption. By measuring the rate at which particles fall under gravity through a liquid having known properties as described by Stokes’ law, the SediGraph determines the equivalent spherical diameter of particles ranging from 300 to 0.1 micrometers.

The new generation SediGraph III Plus combines this proven technique with new technology to deliver reproducible and highly accurate particle size information, completing most analyses in minutes.

Intelligent Design Features

The SediGraph III Plus offers advanced instrumentation features that ensure measurements are repeatable and easy to perform. New features make it easier to operate and maintain the instrument, and the results can be reliably reproduced by SediGraphs in other locations.
Design improvements include:

  • High-precision x-ray tube with a lifetime warranty (7-years)
  • Windows operating software with Ethernet connectivity provides point-and-click selection, networking, printer selection, cut-and paste, and much more
  • Utilization of a simplified pumping system ensures fast and easy maintenance
  • Reduced noise level for a quieter working environment
  • A maintenance reminder, based on the number of analyses performed, alerts you when it is time for routine maintenance
  • Computer-controlled mixing chamber temperature improves repeatability and reproducibility
  • A highly versatile and interactive reporting system provides a wide range of custom data presentation options and now includes particle settling velocity and grain size in Phi units

A Wide Variety of Benefits:

Fully automatic operation increases sample throughput and reduces operator involvement in addition to reducing the opportunity for human error

Temperature-controlled analyses assure that liquid properties remain constant throughout the analysis so you can be confident of accurate and reproducible results

Multiple analysis speeds allow you to choose the desired combination of speed and resolution that meets your needs

Real-Time display allows you to monitor the cumulative mass plot of the current analysis and to make immediate procedural changes if needed

Statistical process control (SPC) reports track the performance of your processes allowing immediate response to fluctuations

Plot overlays provide a visual comparison of analysis results from one or more analyses; a reference or baseline analysis, for example, or a superposition of two different types of plots of the same analysis data

Complete particle accountability assures that all of the introduced sample is accounted for, including fractions below 0.1 µm

Capability to merge data with that from other particle sizing methods, thus extending the range of reported data to 125,000 µm (125 mm), excellent for geological applications

Scanning the sedimentation cell from bottom to top allows accurate inventory of fast-settling particles while minimizing the time required to resolve the separation of fine particles

Multiple analyzer control allows two SediGraph III’s to be operated simultaneously from a single computer, conserving valuable lab space and making data storage convenient

Data comparison plots provide graphical displays of the mathematical difference between two data sets (difference from reference plot) or the extent of a data point value above or below a tolerance boundary (out of specification plot)